Simultaneous Atomic Imaging of Atomic Force Microscopy and Scanning Tunneling Microscopy Using Metal Coated Cantilevers
-
- Sawada Daisuke
- Graduate School of Engineering, Osaka University
-
- Hirai Akira
- Graduate School of Engineering, Osaka University
-
- Sugimoto Yoshiaki
- Graduate School of Engineering, Osaka University
-
- Abe Masayuki
- Graduate School of Engineering, Osaka University PRESTO, Japan Science and Technology Agency
-
- Morita Seizo
- Graduate School of Engineering, Osaka University
この論文をさがす
抄録
Imaging of surface atoms with simultaneous measurement of noncontact atomic force microscopy (NC-AFM) and scanning tunneling microscopy (STM) is performed. Si cantilever coated with PtIr provides stable AFM/STM operations to obtain high spatial resolution images. AFM/STM measurements on Si(111)-(7×7), Ge(111)-c(2×8), and TiO2(110) surfaces are presented at room temperature. On the Ge(111)-c(2×8) surface, adatom and restatom sites which have the same atomic patterns are determined from dual bias AFM/STM measurements.
収録刊行物
-
- MATERIALS TRANSACTIONS
-
MATERIALS TRANSACTIONS 50 (5), 940-942, 2009
公益社団法人 日本金属学会
- Tweet
キーワード
詳細情報 詳細情報について
-
- CRID
- 1390001204249403648
-
- NII論文ID
- 10024814113
- 130004454240
-
- NII書誌ID
- AA1151294X
-
- ISSN
- 13475320
- 13459678
-
- NDL書誌ID
- 10213868
-
- 本文言語コード
- en
-
- データソース種別
-
- JaLC
- NDL
- Crossref
- CiNii Articles
- KAKEN
-
- 抄録ライセンスフラグ
- 使用不可
