書誌事項
- タイトル別名
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- Investigation of elemental analysis in plants by the X-ray (fluorescence) fundamental parameter method.
- ファンダメンタル パラメータホウ オ リヨウシタ ケイコウ Xセン ブンセキホ
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抄録
X-ray fluorescence analysis (XRF) has been widely used for elemental analysis in the field of quality control and research, since it allows non-destructive analysis and sample preparation is easy. In general, quantitative analysis is carried out using a calibration curve obtained from many standard samples. However, for some applications such as analysis of plant samples, it may be difficult to prepare standard materials. The recent development of the fundamental parameter method (FP method) makes it possible to perform quantitative analysis using only a few standards or reference samples. In the qualitative analysis program, semiquantitative results can be calculated using the X-ray intensities for the detected elements. The recent application of XRF to plant analysis using the FP method is discussed.
収録刊行物
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- 日本生態学会誌
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日本生態学会誌 45 (1), 9-18, 1995
一般社団法人 日本生態学会
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詳細情報 詳細情報について
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- CRID
- 1390001204292279424
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- NII論文ID
- 110001881974
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- NII書誌ID
- AN00193852
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- ISSN
- 2424127X
- 00215007
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- NDL書誌ID
- 3617072
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可