High Etch-Resistant Silicon Containing Bilayer Resist:-Lithographic Performance & Outgassing Studies
-
- Hosono Takahashi
- Advanced Materials Development Division 2, Tokyo Ohka Kogyo Co., LTD
-
- Yamada Tomotaka
- Advanced Materials Development Division 2, Tokyo Ohka Kogyo Co., LTD
-
- Kawana Daisuke
- Advanced Materials Development Division 2, Tokyo Ohka Kogyo Co., LTD
-
- Sato Kazufumi
- Advanced Materials Development Division 2, Tokyo Ohka Kogyo Co., LTD
-
- Hu Sunlin
- Dow Corning Corporation
-
- Tecklenburg Ronald E.
- Dow Corning Corporation
-
- Wyman David L.
- Dow Corning Corporation
-
- Maghoodi Sina
- Dow Corning Corporation
-
- Moyer Eric S.
- Dow Corning Corporation
この論文をさがす
抄録
Highly etch resistant poly(silsesquioxane) based resists for ArF lithographic application have been developed. This paper reports on the development of a high etch resistant, high glass transition temperature bilayer resist system capable of imaging film thicknesses of 50 nm while maintaining the ability to transfer the images to the thick underlayer during the etching step. Silicon contents of greater than 23 weight percent were effectively incorporated into the polymer backbone by optimization of the silsesquioxane based structure. As with other poly(silsesquioxane) based polymer systems, placement of the silicon into the polymer backbone allows the incorporation of very high levels of silicon, while generating no detectable levels of outgassed silicon containing species during the 193 nm exposure.
収録刊行物
-
- Journal of Photopolymer Science and Technology
-
Journal of Photopolymer Science and Technology 18 (3), 365-372, 2005
フォトポリマー学会
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1390001204326222720
-
- NII論文ID
- 130004833037
- 40006743910
-
- NII書誌ID
- AA11576862
-
- COI
- 1:CAS:528:DC%2BD2MXmtVCntbk%3D
-
- ISSN
- 13496336
- 09149244
-
- NDL書誌ID
- 7338271
-
- 本文言語コード
- en
-
- データソース種別
-
- JaLC
- NDL
- Crossref
- CiNii Articles
-
- 抄録ライセンスフラグ
- 使用不可