書誌事項
- タイトル別名
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- Determination of Hazardous Atmospheric Pollutants (Hazardous Elements) by X-ray Fluorescence Analysis Using Thin Film Standards.
- ハクマク ヒョウジュン シリョウ オ モチイタ ケイコウ Xセン ブンセキホウ
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説明
An application of wavelength dispersive X-ray fluorescence analysis (XRF) for the determination of 20 elements, including 3 major and 17 hazardous elements, in the atmospheric particulate matters was examined. Rapid and accurate measurement of the elements could be performed by the use of thin film standards. The precision and detection limit of the method were found to be satisfactory. The method established in this study was applied to the analysis of 10 atmospheric particulate matters collected in Nara City in a period of Apr., 1997. Among 17 hazardous elements, Zn was the highest and was followed by Ti, Mn, Br, Ba, Cr, Sb, V, Sn, Ni, As and Se. Co, Pd, Ce, Pt and Tl were less than detection limits. The principal component analysis showed that metal elements were divided into three major groups.
収録刊行物
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- 環境化学
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環境化学 8 (2), 267-274, 1998
一般社団法人 日本環境化学会
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詳細情報 詳細情報について
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- CRID
- 1390001204369501568
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- NII論文ID
- 10009671474
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- NII書誌ID
- AN10547099
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- ISSN
- 18825818
- 09172408
- http://id.crossref.org/issn/09172408
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- NDL書誌ID
- 4503941
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDLサーチ
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可
