An Efficient Test and Repair Flow for Yield Enhancement of One-Time-Programming NROM-Based ROMs
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- LI Tsu-Lin
- Dept. of Electrical Engineering, National Taiwan University of Science and Technology
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- HASHIZUME Masaki
- Dept. of Information Solution, The Univ. of Tokushima
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- LU Shyue-Kung
- Dept. of Electrical Engineering, National Taiwan University of Science and Technology
説明
NROM is one of the emerging non-volatile-memory technologies, which is promising for replacing current floating-gate-based non-volatile memory such as flash memory. In order to raise the fabrication yield and enhance its reliability, a novel test and repair flow is proposed in this paper. Instead of the conventional fault replacement techniques, a novel fault masking technique is also exploited by considering the logical effects of physical defects when the customer's code is to be programmed. In order to maximize the possibilities of fault masking, a novel data inversion technique is proposed. The corresponding BIST architectures are also presented. According to experimental results, the repair rate and fabrication yield can be improved significantly. Moreover, the incurred hardware overhead is almost negligible.
収録刊行物
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- IEICE Transactions on Information and Systems
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IEICE Transactions on Information and Systems E96.D (9), 2026-2030, 2013
一般社団法人 電子情報通信学会
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詳細情報 詳細情報について
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- CRID
- 1390001204378167296
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- NII論文ID
- 130003370992
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- ISSN
- 17451361
- 09168532
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可