Scan Chain Ordering to Reduce Test Data for BIST-Aided Scan Test Using Compatible Scan Flip-Flops
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- YOTSUYANAGI Hiroyuki
- Dept. of Information Solution, Institute of Technology and Science, University of Tokushima
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- YAMAMOTO Masayuki
- Dept. of Information Solution, Institute of Technology and Science, University of Tokushima
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- HASHIZUME Masaki
- Dept. of Information Solution, Institute of Technology and Science, University of Tokushima
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説明
In this paper, the scan chain ordering method for BIST-aided scan test for reducing test data and test application time is proposed. In this work, we utilize the simple LFSR without a phase shifter as PRPG and configure scan chains using the compatible set of flip-flops with considering the correlations among flip-flops in an LFSR. The method can reduce the number of inverter codes required for inverting the bits in PRPG patterns that conflict with ATPG patterns. The experimental results for some benchmark circuits are shown to present the feasibility of our test method.
収録刊行物
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- IEICE Transactions on Information and Systems
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IEICE Transactions on Information and Systems E93-D (1), 10-16, 2010
一般社団法人 電子情報通信学会
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詳細情報 詳細情報について
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- CRID
- 1390001204379032064
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- NII論文ID
- 10026812956
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- NII書誌ID
- AA10826272
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- ISSN
- 17451361
- 09168532
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可