書誌事項
- タイトル別名
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- Characterization of Impurities in Synthetic Diamonds by Using Synchrotron Radiation X-ray Fluorescence Analysis.
- ホウシャコウ ケイコウ Xセン ブンセキ オ モチイル ゴウセイ ダイヤモンド
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抄録
Trace impurities in synthetic diamonds are characterized by using a scanning x-ray microprobe with synchrotron radiation. The diamond crystals analyzed were grown under high pressure and high temperature with the various metalic solvents. Utilizing synchrotron radiation (SR) x-ray fluorescence (XRF) analysis, concentrations of trace impurities down to 0. 1 ppm can be evaluated. Moreover, the x-ray energy dependence of XRF yield around the absorption edge shows the near-edge x-ray absorption fine structure of the trace impurities, which provides chemical-state information on the trace impurities in the diamond crystal. The future expectation of analytical capability with the next generation synchrotron light source is also described.
収録刊行物
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- 高圧力の科学と技術
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高圧力の科学と技術 8 (3), 147-154, 1998
日本高圧力学会
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詳細情報 詳細情報について
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- CRID
- 1390001204380885632
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- NII論文ID
- 10002849201
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- NII書誌ID
- AN10452913
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- ISSN
- 13481940
- 0917639X
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- NDL書誌ID
- 4546290
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可