A Method for Selecting Test Patterns for Defect-Aware Test by using 0-1 Integer Linear Program

DOI Web Site

Bibliographic Information

Other Title
  • 0-1整数計画問題を利用した欠陥検出向けテストパターン選択法
  • 0-1 セイスウ ケイカク モンダイ オ リヨウ シタ ケッカン ケンシュツ ムケ テストパターン センタクホウ

Search this article

Description

With shrinking of LSIs, the diversification of defective mode becomes a critical issue. N-detection tests have been known as an effective way for achieving high defect coverage, however the large number of test pattern counts is the problem. In this paper, we propose metrics(defect detection probability) based on the fault excitation functions to evaluate test patterns for transition faults. We also formulate the method for selecting the test patterns from the N-detection test set based on the defect detection probability as a 0-1 integer linear program. From the experimental results, we show that the set of selected test patterns can detect the larger number of fault models than the given test set with the same number of test patterns.

Journal

Keywords

Details 詳細情報について

Report a problem

Back to top