Scallop Reduction in Bosch Process Using a Small Chamber and Rapid Gas Switching Rate
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- Tanaka Hiroyuki
- National Institute of Advanced Industrial Science and Technology National Institute of Advanced Industrial Science and Technology
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- Ogiso Hisato
- National Institute of Advanced Industrial Science and Technology National Institute of Advanced Industrial Science and Technology
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- Nakano Shizuka
- National Institute of Advanced Industrial Science and Technology National Institute of Advanced Industrial Science and Technology
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- Hayami Toshihiro
- National Institute of Advanced Industrial Science and Technology SPP Technologies Co., Ltd.
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- Miyazaki Toshiya
- National Institute of Advanced Industrial Science and Technology SPP Technologies Co., Ltd.
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- Khumpuang Sommawan
- National Institute of Advanced Industrial Science and Technology National Institute of Advanced Industrial Science and Technology
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- Hara Shiro
- National Institute of Advanced Industrial Science and Technology National Institute of Advanced Industrial Science and Technology
Bibliographic Information
- Other Title
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- ミニマルエッチング装置を用いたボッシュプロセスにおけるスキャロップの低減化
- ミニマルエッチング ソウチ オ モチイタ ボッシュプロセス ニ オケル スキャロップ ノ テイゲンカ
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Description
<p>We have developed an inductively-coupled plasma-reactive ion etching system (ICP-RIE) in a human-size machine of minimal fab for processing a half-inch wafer. The etching system has performed a Bosch etching process with a short switching cycle in a tiny chamber with a volume of 1/4ℓ. For the tiny chamber, a plasma density generated by typical radio frequency of 13.56 MHz is too low according to the small space of the chamber. Thus, a higher frequency of 100 MHz is employed for a high density plasma operation although the power consumed is only ~40W. The Si etching rate of the Bosch process is ~2.5µm/min. Moreover, owing to a fast residence time of ~0.2 second, deposition gas (C4F8) and etching gas (SF6) are exchanged rapidly, which makes a Bosch cycle time of only 2 seconds. The resultant etching sidewall of Si structure becomes a scallop-less straight wall.</p>
Journal
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- IEEJ Transactions on Sensors and Micromachines
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IEEJ Transactions on Sensors and Micromachines 136 (12), 499-504, 2016
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390001204460117888
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- NII Article ID
- 130005171122
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- NII Book ID
- AN1052634X
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- ISSN
- 13475525
- 13418939
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- NDL BIB ID
- 027784776
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles
- OpenAIRE
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- Abstract License Flag
- Disallowed