Junction Temperature Prediction Technique for LSI
-
- Taoka Naoto
- Production and Technology Unit, Packaging & Test Technology Division, System Package Engineering Department, Renesas Electronics Corporation
Bibliographic Information
- Other Title
-
- システム実装を支える設計・シミュレーション技術 発熱チップの温度予測技術
- 発熱チップの温度予測技術
- ハツネツ チップ ノ オンド ヨソク ギジュツ
Search this article
Journal
-
- Journal of The Japan Institute of Electronics Packaging
-
Journal of The Japan Institute of Electronics Packaging 13 (4), 268-274, 2010
The Japan Institute of Electronics Packaging
- Tweet
Details 詳細情報について
-
- CRID
- 1390001204559635456
-
- NII Article ID
- 10030703062
-
- NII Book ID
- AA11231565
-
- COI
- 1:CAS:528:DC%2BC3cXpvVekt7k%3D
-
- ISSN
- 1884121X
- 13439677
-
- NDL BIB ID
- 10763715
-
- Text Lang
- ja
-
- Data Source
-
- JaLC
- NDL
- Crossref
- CiNii Articles