書誌事項
- タイトル別名
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- Consideration of Direct Bit-Rate Measuring Method based on Extracting Envelope Signal
- ホウラクセン シンゴウ チュウシュツ ニ ヨル ビット レート チョクセツ ソクテイホウ ノ ケントウ
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We previously developed an optical sampling oscilloscope (EDT-OSO) based on an envelope detection triggering method. This EDT-OSO can stably measure eye-diagram waveforms of signals exceeding 100Gbps without an external high-frequency clock signal. However far-end waveform measurements during a long distance place could not be realized. Because the EDT-OSO requires to link 10-MHz time bases in the EDT-OSO and a light under test (LUT) generator for synchrinizing.<br>To overcom this drawbak, we developed a direct bit-rate measureing method for synchronizing both 10-MHz time bases vartually and a self-synchronized EDT-OSO (SSEDT-OSO) based on this method simulteniously. We confirmed that a bit-rate measurement repetability of the SSEDT-OSO was from 10-9 to 10-8 by evaluating a standard deviation and the SSEDT-OSO could measure an eye-diagram without linking 10-MHz time bases.<br>This paper explains the basic principle for measuring the bit-rate of the LUT directly. Furthermore, we describe a configuration of the SSEDT-OSO and evalluation results.
収録刊行物
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- 電気学会論文誌. A
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電気学会論文誌. A 128 (11), 669-675, 2008
一般社団法人 電気学会
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詳細情報 詳細情報について
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- CRID
- 1390001204593080832
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- NII論文ID
- 10024343090
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- NII書誌ID
- AN10136312
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- ISSN
- 13475533
- 03854205
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- NDL書誌ID
- 9698449
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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