RF-SiP Technology of Reflect-meter for RF Testers
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- Kimishima Masayuki
- ATE Unit Development Group, ADVANTEST CORPORATION Graduate School of Engineering, Utsunomiya University
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- Nakayama Yoshikazu
- ATE Unit Development Group, ADVANTEST CORPORATION
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- Kogami Yoshinori
- Graduate School of Engineering, Utsunomiya University
Bibliographic Information
- Other Title
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- RFテスタ用リフレクトメータのSiP化技術
- RF テスタヨウ リフレクトメータ ノ SiPカ ギジュツ
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Abstract
Technologies of the small size reflect-meter constructed in form of RF functional systems in package (SiPs) for RF testers are described. As primary concerns, focusing on the directivity and dynamic range of the reflect-meter performance, we propose the construction and the core circuit topologies to realize a very small reflect-meter SiP that satisfies functions of the vector network analysis for RF testers. The reflect-meter features a very small size of less than 1/50 compared to our conventional hybrid form reflect-meter, and having good performance for RF testers.
Journal
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- IEEJ Transactions on Electronics, Information and Systems
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IEEJ Transactions on Electronics, Information and Systems 133 (3), 450-463, 2013
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390001204607935616
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- NII Article ID
- 10031155331
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- NII Book ID
- AN10065950
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- ISSN
- 13488155
- 03854221
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- NDL BIB ID
- 024347711
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed