書誌事項
- タイトル別名
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- Magnetic field distribution of shadow mask and its influence on electron trajectory.
説明
It is well known that, in a color CRT, color change occurs due to the magnetization of a shadow mask and frame under the environmental magnetic field. In order to clarify the influence of the magnetization of a shadow mask and frame quantitatively, we measured the magnetic field distribution around the mask and frame, and calculated the electron beam trajectory change with a slit model to simulate a shadow mask. The results show that the remarkable change of the trajectory and velocity of electron beam occur in the slit region with the high magnetic flux density.
収録刊行物
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- 日本応用磁気学会誌
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日本応用磁気学会誌 14 (2), 403-406, 1990
公益社団法人 日本磁気学会
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詳細情報 詳細情報について
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- CRID
- 1390001205089924480
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- NII論文ID
- 130004477777
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- COI
- 1:CAS:528:DyaK3MXhtlCjt7Y%3D
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- ISSN
- 18804004
- 02850192
- 08824959
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
- OpenAIRE
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- 抄録ライセンスフラグ
- 使用不可
