書誌事項
- タイトル別名
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- Crystallographic Orientation Measurement in Alumina Using Raman-Microprobe Polarization.
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The crystallographic orientations of individual grains in translucent alumina were successfully determined using polarized Raman spectroscopy. The following results were obtained.<br>(1) Raman tensor elements of sapphire, a and b, belonging to the A1g mode were obtained and it was revealed that a<<b for 645cm-1 line. Consequently, the polarized Raman intensity is given by cosφ.<br>(2) Projection angles of the c-axis of individual alumina grains were determined by the polarized Raman peak of 645cm-1 line which belongs to the A1g mode. In the special case of constant Raman intensity for sample rotation, the c-axis was perpendicular to the measured plane.<br>(3) Adjoining grains in translucent alumina were found to have different crystal orientations. These were experimentally determined in this study.
収録刊行物
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- Journal of the Ceramic Society of Japan (日本セラミックス協会学術論文誌)
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Journal of the Ceramic Society of Japan (日本セラミックス協会学術論文誌) 108 (1262), 888-891, 2000
公益社団法人 日本セラミックス協会
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詳細情報 詳細情報について
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- CRID
- 1390001205249588096
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- NII論文ID
- 110002289921
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- NII書誌ID
- AN10040326
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- ISSN
- 18821022
- 09145400
- http://id.crossref.org/issn/09145400
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- NDL書誌ID
- 5506860
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可
