Application of Measurement multiple-image fourier of fast phenomena transform spectral imaging to measurement of fast phenomena
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- HIRAI Akiko
- Department of Applied Physics, Faculty of Engineering, Osaka University, 2–1, Yamada–oka, Suita, Osaka, 565 Japan
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- INOUE Takashi
- Department of Applied Physics, Faculty of Engineering, Osaka University, 2–1, Yamada–oka, Suita, Osaka, 565 Japan
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- ITOH Kazuyoshi
- Department of Applied Physics, Faculty of Engineering, Osaka University, 2–1, Yamada–oka, Suita, Osaka, 565 Japan
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- ICHIOKA Yoshiki
- Department of Applied Physics, Faculty of Engineering, Osaka University, 2–1, Yamada–oka, Suita, Osaka, 565 Japan
書誌事項
- タイトル別名
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- Application of Multiple-Image Fourier Transform Spectral Imaging to Measurement of Fast Phenomena
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説明
A new interferometric technique that simultaneously acquires all optical data necessary to reconstruct a spectral image is proposed. The optical data is a two-dimensional array of two-dimensional interference patterns. The data are acquired by an optical system consisting of a two-dimensional lens array and a Michelson interferometer. The interference patterns are generally distorted by the errors in path differences. These errors can be estimated beforehand and corrected in the process of reconstruction of the spectral image. Experimental results obtained with this technique applied to a fast phenomenon are also presented.
収録刊行物
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- Optical Review
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Optical Review 1 (2), 205-207, 1994
公益社団法人 応用物理学会分科会 日本光学会
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詳細情報 詳細情報について
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- CRID
- 1390001205527392768
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- NII論文ID
- 10017054471
- 10000085017
- 130004650926
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- NII書誌ID
- AA11029291
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- BIBCODE
- 1994OptRv...1..205H
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- ISSN
- 13499432
- 13406000
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- 本文言語コード
- en
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- データソース種別
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- JaLC
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- CiNii Articles
- OpenAIRE
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- 抄録ライセンスフラグ
- 使用不可