Missing-Dimer Structures and Their Kink Defects on Molecular Beam Epitaxially Grown(2×4)Reconstructed(001)InP and GaAs Surfaces Studied by Ultrahigh-Vacuum Scanning Tunneling Microscopy
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- Ishikawa Yasuhiko
- Research Center for Interface Quantum Electronics and Graduate School of Electronics and Information Engineering, Hokkaido University, N13 W8, Sapporo 060, Japan
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- Fukui Takashi
- Research Center for Interface Quantum Electronics and Graduate School of Electronics and Information Engineering, Hokkaido University, N13 W8, Sapporo 060, Japan
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- Hasegawa Hideki
- Research Center for Interface Quantum Electronics and Graduate School of Electronics and Information Engineering, Hokkaido University, N13 W8, Sapporo 060, Japan
書誌事項
- タイトル別名
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- Missing-Dimer Structures and Their Kink Defects on Molecular Beam Epitaxially Grown (2*4) Reconstructed (001) InP and GaAs Surfaces Studied by Ultrahigh-Vacuum Scanning Tunneling Microscopy.
- Missing-Dimer Structures and Their Kink
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抄録
InP and GaAs(001)-(2× 4) reconstructed surfaces prepared by molecular beam epitaxy (MBE) were studied by ultrahigh-vacuum scanning tunneling microscopy (UHV-STM) in combination with X-ray photoelectron spectroscopy (XPS). It was found that the missing dimers and their kink defects on InP have remarkably different properties from those of GaAs. Based on this finding, a new missing-dimer structure is proposed for InP (2× 4) surfaces. As to the kink defects, no correlation was found on InP between the kink defect density and the Si doping level, although the XPS peaks clearly showed existence of Fermi level pinning. Thus, the model proposed recently by Pashley et al. does not apply to the InP surface.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 36 (3B), 1749-1755, 1997
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390001206247711232
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- NII論文ID
- 210000040855
- 110003946880
- 130004523473
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- NII書誌ID
- AA10457675
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 4196705
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
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- 抄録ライセンスフラグ
- 使用不可