Element-Specific Contrast in Scanning Tunneling Microscopy via Resonant Tunneling.

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  • Himpsel Franz J.
    Department of Physics, University of Wisconsin, Madison WI 53706–1390, USA
  • Jung Thomas
    IBM Research Division, Säumerstraße 4, 8803 Rüschlikon, Switzerland
  • Schlittler Reto
    IBM Research Division, Säumerstraße 4, 8803 Rüschlikon, Switzerland
  • Gimzewski Jim K.
    IBM Research Division, Säumerstraße 4, 8803 Rüschlikon, Switzerland

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  • Element-Specific Contrast in Scanning T

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説明

An element-specific version of scanning tunneling spectroscopy for metals is presented. Contrast between two metals is achieved by resonant tunneling via surface states and image states. These states are characterized independently by inverse photoemission. Image states provide elemental identification via the work function, since their energy is correlated with the local work function. Element-specific surface states produce contrast at higher spatial resolution, but the contrast is smaller than that for image states. These imaging techniques are used to study the growth modes of Cu stripes on stepped W(110) and Mo(110) surfaces.

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