Direct Measurement of Sheath Electric Field Distribution in Front of Substrate in Electron Cyclotron Resonance Plasma by Laser-Induced Fluorescence Technique.
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- Watanabe Mahiko
- Department of Applied Physics and Chemistry, Faculty of Engineering, Hiroshima University,<BR> 1-4-1, Kagamiyama, Higashi-Hiroshima 739-8527, Japan
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- Takiyama Ken
- Department of Applied Physics and Chemistry, Faculty of Engineering, Hiroshima University,<BR> 1-4-1, Kagamiyama, Higashi-Hiroshima 739-8527, Japan
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- Oda Toshiatsu
- Faculty of Engineering, Hiroshima Kokusai Gakuin University, Nakano, Aki-ku, Hiroshima 739-0321, Japan
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抄録
The first reported direct measurement of a sheath electric field structure was made in front of a substrate in an electron cyclotron resonance plasma flow in a magnetic field using polarized laser-induced fluorescence spectroscopy. A linear decrease of the electric field strength was found relative to the distance from the substrate surface. The sheath thickness was proportional to the square root of the applied bias voltage. The experimental results can be explained by a simple sheath model.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 39 (2A), L116-L118, 2000
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390001206254133504
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- NII論文ID
- 110003928695
- 210000048320
- 130004527041
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- NII書誌ID
- AA10650595
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 4986346
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
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- 抄録ライセンスフラグ
- 使用不可