Microstructures of Cooked Rice and Treatment with a High-voltage Electric Field.
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- AIBARA Shigeo
- Research Institute for Food Science, Kyoto University
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- UMEKI Kanae
- Department of Food Science and Nutrition, Teikoku Women's University
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- SHIBATA Katsumi
- Department of Food Science and Nutrition, Teikoku Women's University
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- HIGASA Takahiko
- Research Institute for Food Science, Kyoto University
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- WATANABE Kiyoshi
- Shishinden Company
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- HIROSE Masaaki
- Research Institute for Food Science, Kyoto University
Bibliographic Information
- Other Title
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- 米飯の微細構造と高圧電場処理
- ベイハン ノ ビサイ コウゾウ ト コウアツ デンバ ショリ
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Description
Microstructures in the endosperms of newly polished rice that had been freshly harvested and those f rice polished after having been in storage, were found to show no outstanding differences. As to the surface of the polished rice grains, however, aleurone particles were removed almost completely from the surface of fresh rice by the polishing process, and only aleurone cell membranes were left behind. In contrast, the surface of stored rice was found to be covered completely with aleurone particles even after being polished. Numerous characteristic small holes appeared on the surface and in the starchy endosperm of rice cooked soon after being harvested, but they were not observed in rice cooked after storage, unless it had first been exposed to a high-voltage electric field (HVEF), in which case the small holes were limited to part of the grain periphery. The latter phenomenon was more pronounced in cases where the rice was exposed to HVEF while being soaked in water prior to cooking than in cases where the rice was exposed directly. We can conclude that the presence of small holes in the peripheral layer (as seen in cross-section) of the grain surface is dependent on the state of water imbibed during exposure to HVEF.
Journal
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- Nippon Eiyo Shokuryo Gakkaishi
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Nippon Eiyo Shokuryo Gakkaishi 46 (1), 77-82, 1993
Japan Society of Nutrition and Food Science
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Details 詳細情報について
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- CRID
- 1390001206291255424
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- NII Article ID
- 130000853588
- 10006589048
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- NII Book ID
- AN00311992
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- ISSN
- 18832849
- 02873516
- http://id.crossref.org/issn/00215376
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- NDL BIB ID
- 3811791
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed