Oxygen Deficiency and Electrical Conductivity in LnNiO3-z (Ln=La, Pr) and LaCuO3-z.
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- Takeda Yasuo
- Department of Chemistry, Faculty of Engineering, Mie University
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- Hashimoto Hiroshi
- Department of Chemistry, Faculty of Engineering, Mie University
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- Sato Atsushi
- Department of Chemistry, Faculty of Engineering, Mie University
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- Imanishi Nobutuki
- Department of Chemistry, Faculty of Engineering, Mie University
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- Yamamoto Osamu
- Department of Chemistry, Faculty of Engineering, Mie University
Bibliographic Information
- Other Title
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- ＬｎＮｉＯ３－ｚ（Ｌｎ＝Ｌａ，Ｐｒ）及びＬａＣｕＯ３－ｚの酸素欠損と電気伝導
- Ln Ni O3-z Ln La Pr オヨビ La Cu O3-z ノ サン
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Description
We report the preparation, structure and electrical properties of LaNiO3-z, PrNiO23-z and LaCuO3-x. Wide range of oxygen deficiency was realized by changing the synthetic oxygen pressure. These systems show metallic conductivity even for the samples having a large amount of oxygen vacancy (Z<0.25). The Seebeck coefficient measurement showed that the dominant carrier in LnNiO3-z system is electron, while hole carrier is dominant in LaCuO3-z system.
Journal
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- Journal of the Japan Society of Powder and Powder Metallurgy
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Journal of the Japan Society of Powder and Powder Metallurgy 39 (5), 345-348, 1992
Japan Society of Powder and Powder Metallurgy
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Details 詳細情報について
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- CRID
- 1390001206304679296
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- NII Article ID
- 130000818164
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- NII Book ID
- AN00222724
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- ISSN
- 18809014
- 05328799
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- NDL BIB ID
- 3769693
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed
