書誌事項
- タイトル別名
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- X-ray Diffraction Data on .KAPPA.-Alumina.
- カッパ アルミナ ノ Xセン カイセツ データ ニ ツイテ
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κ-alumina films were deposited on WC-Co alloy by a CVD method with an under layer of TiC. Powder samples were also prepared by disolving steel sheets on which TiC/Al2O3 or TiC/Al2O3/TiN were deposited. These specimens were examined by X-ray diffraction to obtain more exact diffraction data for practical use.<BR>Diffraction profiles of the films and the powders were analyzed with a hexagonal system. CVD-coated films showed strong orientation, namely c-axis being rectangular to the film plane. κ-Al2O3 has lattice constants of a0=9.632A and c0=8.929A as a hexagonal system. These values correspond to a0=4.816A, b0=8.342A and c0=8.929A of an orthorhombic system.
収録刊行物
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- 粉体および粉末冶金
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粉体および粉末冶金 44 (1), 96-101, 1997
一般社団法人 粉体粉末冶金協会
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詳細情報 詳細情報について
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- CRID
- 1390001206306982016
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- NII論文ID
- 10002013354
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- NII書誌ID
- AN00222724
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- ISSN
- 18809014
- 05328799
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- NDL書誌ID
- 4118705
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可
