Electronic Density of State of Mn-N Thin Films Measured by XPS

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  • Mn-N化合物薄膜の電子状態密度のXPS測定
  • Mn N カゴウブツ ハクマク ノ デンシ ジョウタイ ミツド ノ XPS ソクテイ

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Abstract

Polycrystalline thin films with an oriented direction of ε-Mn4N along the (111) axis and of η-Mn3N2 along the (113) axis were prepared as a single phase by RF reactive magnetron sputtering method. A comparison of XPS spectral analysis with discrete Variational-Xα method showed that the N atoms in Mn-N compounds behave as a donor and govern the magnetic properties of the films. The ε-Mn4N films was a single phase perovskait type crystal with lattice parameter 0.386 nm, and this films had properties of the ferrimagnetism with 1.1 μB per unit cell. The η-Mn3N2 films was face center tetragonal (a = 0.4205 nm, c = 1.2131 nm), and it had properties of antiferromagnetism with 0.4 μB per unit cell.

Journal

  • Hyomen Kagaku

    Hyomen Kagaku 24 (8), 480-484, 2003

    The Surface Science Society of Japan

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