Inhibition of Whisker Growth from Zinc Electroplate

DOI Web Site 1 Citations 5 References Open Access

Bibliographic Information

Other Title
  • 亜鉛めっきのホイスカ抑止について

Description

Spontaneous growth of whiskers from electroplated zinc is known to occur at room temperature. Since whiskers may occasionally cause short-circuiting, prevention of the whisker growth is a technologically important problem in the electronics industry. Recently, a new problem that zinc whiskers from zinc plated props at raised access floor are transported into a computer through the cooling fan and cause shut down of the computer, is occurred. High concentrations of cyanide in zinc baths contribute to the role of the brightener and lead to declined internal stress levels in the plating, which significantly affects the inhibition of whisker growth.

Journal

  • Hyomen Kagaku

    Hyomen Kagaku 26 (3), 165-170, 2005

    The Surface Science Society of Japan

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