書誌事項
- タイトル別名
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- Thermal Fatigue Life Evaluation of Lead-Free Solder Joint of Chip Size Package with Underfill
抄録
The effect of filler content in an underfill material on thermal fatigue life of a lead-free solder joint of a chip size package (CSP) has been investigated. Three types of bisphenol-F-type epoxy-based underfill material, which filler content was changed from 0 to 60 mass%, were prepared. The thermal cycle test in a temperature range from -40 to 125°C was conducted to investigate thermal fatigue lives of solder joints encapsulated with underfill materials. Plastic strain range loaded in the solder joint under thermal cycle conditions was investigated by a finite element analysis method. From the thermal cycle test results, it was clarified that the thermal fatigue life of the solder joint increases with increasing filler content in the underfill material investigated. Moreover, a Coffin-Manson-type of relation was obtained between the plastic strain range and the thermal fatigue life. n value in the Coffin-Manson's equation was estimated to be 1.8.<br>
収録刊行物
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- 日本金属学会誌
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日本金属学会誌 72 (3), 244-248, 2008
公益社団法人 日本金属学会
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詳細情報 詳細情報について
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- CRID
- 1390001206477466496
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- NII論文ID
- 130004455968
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- ISSN
- 18806880
- 24337501
- 00214876
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可