書誌事項
- タイトル別名
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- On the Emission of Secondary Ions during Oxygen Ion Bombardment
- サンソ イオン ショウシャジ ノ ニジ イオン セイセイ カテイ ニ ツイテ
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抄録
A simple physical model is proposed for the process of positive ion emission during oxygen ion bombardment of a solid sample. The incident ions are assumed to develop the oxygen enhanced layer at the surface of target and give rise to the emission of diatomic molecules.These clusters of atoms tend to dissociate into atoms and/or emit electrons produce atomic and molecular ions during the process of sputtering.Expressions are given for the relative intensities of ions and are compared successfully with experimental data.
収録刊行物
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- 質量分析
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質量分析 25 (4), 297-304, 1977
一般社団法人 日本質量分析学会
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詳細情報 詳細情報について
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- CRID
- 1390001206497383936
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- NII論文ID
- 130002033385
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- NII書誌ID
- AN0010555X
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- ISSN
- 05428645
- 18804225
- 18843271
- 13408097
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- NDL書誌ID
- 1918233
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可