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- Nitta Shoji
- Department of Electrical Engineering, Gifu University
Bibliographic Information
- Other Title
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- 6. プラズマ・プロセスのアモルファス半導体への応用
- ヒロガル プラズマ ノ アタラシイ オウヨウ プラズマ プロセス 4 プラズマ
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Abstract
Present states of the understanding of the defects creation in the plasma processes to prepare hydrogenated amorphous silicon films a-Si : H are briefly reviewed. Then photo-induced defects creation that is called the Staebler-Wronski effect are also reviewed. Finally dimensionality in amorphous semiconductors are discussed with the example of Si-C system, especially stressed in hydrogenated one dimensional Si-C alloys which are situated between polysilane (SiH2)n and polyacetylene (CH)n.
Journal
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- Kakuyūgō kenkyū
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Kakuyūgō kenkyū 57 (4), 215-222, 1987
The Japan Society of Plasma Science and Nuclear Fusion Research
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Details 詳細情報について
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- CRID
- 1390001206512401792
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- NII Article ID
- 130001407669
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- NII Book ID
- AN00039568
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- ISSN
- 18849571
- 04512375
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- NDL BIB ID
- 3155167
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed