書誌事項
- タイトル別名
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- Electron-and Photosensitivity of <I>N</I>-Allyloxymethyl-polyamide
- N アリロキシメチルカ ポリアミド ノ カン デンシセンセイ オヨビ カンコウ
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抄録
N-Allyloxymethyl-poly (ε-caproamide), prepared by the reaction of formaldehyde and allyl alcohol with poly (ε-caproamide) in the presence of formic acid, has been found to be a highly-sensitive electron-crosslinkable polymer. Polyamides of N-allyloxymethylation degrees over 25 to 30% are soluble in alcoholic solvents, such as methanol and ethanol-water mixture, and are conveniently usable for electron beam lithography. Polymer with 35 to 40% N-allyloxymethylation degree exhibits the best lithographic qualities, the minimum exposure for insolubilization being 5×10-8 coulomb/cm2. This high sensitivity, together with an excellent resolution, makes it one of the most promising materials for electron beam lithography. By addition of photosensitizers, such as aromatic ketones, it can be utilized as a photocrosslinkable material.
収録刊行物
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- 高分子論文集
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高分子論文集 36 (3), 169-174, 1979
公益社団法人 高分子学会
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詳細情報 詳細情報について
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- CRID
- 1390001206523267840
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- NII論文ID
- 130004033816
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- NII書誌ID
- AN00085011
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- ISSN
- 18815685
- 03862186
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- NDL書誌ID
- 2047571
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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- 抄録ライセンスフラグ
- 使用不可