SiGe-mixing-triggered rapid-melting growth for Ge-on-insulator formation―A road to artificial crystal―
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- MIYAO Masanobu
- Department of Electronics, Kyushu University
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- SADOH Taizoh
- Department of Electronics, Kyushu University
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- TOKO Kaoru
- Department of Electronics, Kyushu University
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- KUROSAWA Masashi
- Department of Electronics, Kyushu University
Bibliographic Information
- Other Title
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- SiGeミキシング誘起溶融成長によるGOI(Ge on Insulator)の形成―人工単結晶への道―
- SiGe ミキシング ユウキ ヨウユウ セイチョウ ニ ヨル GOI(Ge on Insulator)ノ ケイセイ : ジンコウタンケッショウ エ ノ ミチ
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Abstract
<p>The development of high-quality Ge-on-insulator (GOI) structures is essential for making a breakthrough into the scaling limit of Si large-scale integrated circuits. In the present paper, we review a new GOI growth technique, i.e., the SiGe-mixing-triggered rapid-melting growth technique, which enables chip-sized and mesh-shaped GOI structures. In addition, the integration of GOI(111) on Si(100) substrates becomes possible by combining this method with the Si-microseeding technique. These progresses pave the way for the artificial single-crystal technology.</p>
Journal
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- Oyo Buturi
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Oyo Buturi 81 (5), 410-414, 2012-05-10
The Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1390001277357329152
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- NII Article ID
- 10030594723
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- NII Book ID
- AN00026679
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- ISSN
- 21882290
- 03698009
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- NDL BIB ID
- 023759978
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- CiNii Articles
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- Abstract License Flag
- Disallowed