Coincidence Measurement Study of Secondary-Ion Emission from Solid Surfaces Excited with Multi-Charge Ions(Current Topics)
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- Motohashi Kenji
- 東洋大学理工学部
Bibliographic Information
- Other Title
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- 同時計測法で探る多価イオン励起固体表面からの二次イオン放出(最近の研究から)
- 同時計測法で探る多価イオン励起固体表面からの二次イオン放出
- ドウジ ケイソクホウ デ サグル タカ イオンレイキコタイ ヒョウメン カラ ノ 2ジ イオン ホウシュツ
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Abstract
When a multi-charge ion approaches some solid surfaces, electron transfer from the surface to the ion causes secondary-ion emission. This is called potential sputtering. However, the details of the atomic processes have not been clarified. A coincidence measurement between reflected and secondary ions was conducted to study the atomic processes. The relationship between desorption-induced by electronic transitions (DIET) and the following ion scattering process was clarified. The results provided new information about potential sputtering.
Journal
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- Butsuri
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Butsuri 65 (8), 629-633, 2010-08-05
The Physical Society of Japan
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Details 詳細情報について
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- CRID
- 1390002184863992320
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- NII Article ID
- 110007685823
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- NII Book ID
- AN00196952
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- ISSN
- 24238872
- 00290181
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- NDL BIB ID
- 10772214
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- CiNii Articles
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- Abstract License Flag
- Disallowed
