低品位銅アノードの不動態化挙動に及ぼす銅電解精製浴中の不純物イオンと添加剤の影響
書誌事項
- タイトル別名
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- Effect of Impurity Ions and Additives in Solution of Copper Electrorefining on the Passivation Behavior of Low-Grade Copper Anode
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説明
<p>The Cu electrorefining using low-grade copper anode is desired from the view point of reduction of electric power. Cu electrolysis was performed using a low-grade copper anode in an unagitated sulfate solution, and the effect of impurity ions and additives in solution on the passivation of anode was investigated. The time when anode passivation firstly occurs shortened significantly in solution containing 0.596 mol·dm−3 of Ni2+ ions as impurity, and shortened somewhat in solution containing As5+(0.053 mol·dm−3) or Bi3+(0.0005 mol·dm−3) ions. Sn2+(0.0004 mol·dm−3) and As3+(0.053 mol·dm−3) ions slightly decreased the time to passivation, but Sb3+ (0.004 mol·dm−3) ions rarely decreased the time. When the 0.596 mol·dm−3 of Ni2+ ions were added in solution, the viscosity coefficient of solution increased and the diffusion coefficient of Cu2+ ions decreased. When the As5+(0.053 mol·dm−3) or Bi3+(0.0005 mol·dm−3) ions were added in solution, the compound of As-Sb-O or As-Bi-O system was formed in anode slime, which seemed to increase the compactness of slime. The time to passivation was slightly longer in thiourea-free solution, but shortened with increasing the concentration of thiourea from 0.525 to 2.24 mmol·dm−3. In the solutions containing 0 to 1.13 mmol·dm−3 of Cl− ions, the time to passivation was constant, but significantly shortened with increasing the concentration of Cl− ions at the region above 1.13 mmol·dm−3. Cl− ions formed CuCl at the upper area of anode slime, as a result, increased the compactness of slime and promoted the passivation.</p>
収録刊行物
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- 日本金属学会誌
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日本金属学会誌 86 (6), 97-106, 2022-06-01
公益社団法人 日本金属学会
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キーワード
詳細情報 詳細情報について
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- CRID
- 1390010765214032128
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- NII書誌ID
- AA1151294X
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- ISSN
- 18806880
- 24337501
- 13475320
- 00214876
- 13459678
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- HANDLE
- 2324/7172648
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- NDL書誌ID
- 032589584
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- IRDB
- NDLサーチ
- Crossref
- KAKEN
- OpenAIRE
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- 抄録ライセンスフラグ
- 使用不可