Development of Highly Reliable Screening by Using X-Ray Fluorescence Spectrometry

DOI

Bibliographic Information

Other Title
  • 蛍光X線分析装置による確度の高いスクリーニング法の開発
  • -Applications to Determine Lead in Tin Plated and Tin-Bismuth Plated Samples-
  • ―すずめっき及びすず－ビスマスめっき中の鉛定量への応用―

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Description

<p>A highly reliable screening method was developed for the determination of lead in tin plated layers and tin-bismuth plated layers. The contents of lead in the layers of the various samples were determined by inductively coupled plasma optical emission spectrometry. The calibration curve for lead in the tin and tin-bismuth plated layers by using WD-XRF exhibited linear correlation from 130 μg/g to 2070 μg/g. Calibration curve of lead normalized with Pb-Lα/Sn-Kα intensity was more linear, and this method was possible to evaluate very small sample. The calibration curve for lead in the tin plated layers by using ED-XRF was good linearly, but it for lead in the tin-bismuth plated layers was affected by Pb-Lα spectrum and Bi-Lα spectrum overlap each other. It was effective for decreasing affect of Bi-Lα spectrum by using curve fitting method.</p>

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Details 詳細情報について

  • CRID
    1390020444395844608
  • DOI
    10.57415/xshinpo.40.0_137
  • ISSN
    27583651
    09117806
  • Text Lang
    ja
  • Data Source
    • JaLC
  • Abstract License Flag
    Allowed

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