放射光を用いた高エネルギーＸ線光電子分光法によるＳｉ（１００）酸化薄膜の深さ方向分析

DOI NDLデジタルコレクション Web Site Web Site 被引用文献2件 参考文献17件

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タイトル別名
  • Application of high-energy synchrotron-radiation X-ray photoelectron spectroscopy to the depth profile analysis of oxide layer on Si(100) surfaces.
  • ホウシャコウ オ モチイタ コウエネルギー Xセン コウデンシ ブンコウホウ

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抄録

The analyzing depth of X-ray photoelectron spectroscopy (XPS) depends on the inelastic mean free path (IMFP) of a photoelectron. Since the IMFP of a photoelectron is a function of its kinetic energy, the analyzing depth of XPS changes with the excitation energy. We apply this relationship to the depth profile analysis of XPS measurements by using energy tunable synchrotron radiation (SR) X-rays. For this purpose, a "High-energy SR-XPS" has been constructed and applied to the depth profile analysis of the two kinds of oxide layer on Si(100) surfaces. These are, 1)the thermally oxidized surface, which is well defined as a thin uniform film of SiO2, and 2)the O2+ -ion implanted surface, which has a depth distribution of oxide. The thickness of the oxide layer and the depth profile of the O2+ -ion implanted layer have been estimated by measuring the intensities of elemental Si to the intensity of SiO2, which are observed from the Si ls XPS spectra at the various photon energies. The results obtained suggest that the present system is feasible for the depth profile analysis of thin films.

収録刊行物

  • 分析化学

    分析化学 45 (2), 169-174, 1996

    公益社団法人 日本分析化学会

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