STM and LEED Analysis of Reconstructions on the 6H-SiC (0001) Surface
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- KITADA Masatoshi
- Department of Electrical Engineering, Kyushu Institute of Technology
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- NAITOH Masamichi
- Department of Electrical Engineering, Kyushu Institute of Technology
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- NISHIGAKI Satoshi
- Department of Electrical Engineering, Kyushu Institute of Technology
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- TOYAMA Naotake
- Department of Electrical Engineering, Kyushu Institute of Technology
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- SHOJI Fumiya
- Faculty of Engineering, Kyushu Kyoritsu University
Bibliographic Information
- Other Title
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- ６Ｈ‐ＳｉＣ（０００￣１）再構成表面の走査トンネル顕微鏡／低速電子線回折法による解析
- ソクホウ 6H SiC 0001 サイコウセイ ヒョウメン ノ ソウサ トンネル ケンビキョウ テイソク デンシセン カイセツホウ ニ ヨル カイセキ
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Abstract
We report results of an investigation in the initial process of graphitization on 6H-SiC (0001) surfaces using scanning tunneling microscopy (STM) and low-energy electron diffraction (LEED). There appeared (3 × 3) and (2 × 2) periodicities in the STM images of the 6H-SiC (0001) surface annealed at 950 and 1000°C, respectively. After annealing the 6H-SiC (0001) surface above 1300°C, many large and small domains with various periodicities were observed in the STM image. This STM image can be explained as Moiré patterns due to different combinations of two graphite layers. In consistent with the STM result, azimuthally-rotated graphite (1 × 1) spots were observed in a LEED pattern, where brightest parts in the diffraction ring define combination of two hexagonal lattices of graphite.
Journal
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- Shinku
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Shinku 46 (6), 505-508, 2003
The Vacuum Society of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390282679039861632
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- NII Article ID
- 10011611085
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- NII Book ID
- AN00119871
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- ISSN
- 18809413
- 05598516
- http://id.crossref.org/issn/05598516
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- NDL BIB ID
- 6639759
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed
