書誌事項
- タイトル別名
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- Electrical Conductivity of Co Thin Films at Low Temperature.
- Co ハクマク ノ テイオン ニ オケル デンキ デンドウ トクセイ
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抄録
The electrical conductivities of Co thin films with the thickness in the range 2.530 nm have been studied. In the low temperature region, the sheet conductivities for the films of 3.05.0 nm show logarithmic temperature dependence. The dependence is interpreted by the electron-electron interaction effect rather than the weak localization effect. The coefficient of the logarithmic behavior is found to be suppressed as the thickness decreases, which may be interpreted in terms of the percolation effect.
収録刊行物
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- 真空
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真空 45 (3), 235-238, 2002
一般社団法人 日本真空学会
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詳細情報 詳細情報について
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- CRID
- 1390282679041531008
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- NII論文ID
- 10008203040
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- NII書誌ID
- AN00119871
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- ISSN
- 18809413
- 05598516
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- NDL書誌ID
- 6144548
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可
