Study on extended appearance potential fine structure of sigle crystal ZnTe.

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  • KONISHI Ryosuke
    Department of Electronics, Faculty of Engieering, Tottori University
  • ARIOKA Masato
    Department of Electronics, Faculty of Engieering, Tottori University
  • SASAKURA Hiroshi
    Department of Electronics, Faculty of Engieering, Tottori University

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Other Title
  • 単結晶ＺｎＴｅの拡張出現電位微細構造に関する研究
  • タンケッショウ ZnTe ノ カクチョウ シュツゲン デンイ ビサイ コウゾウ

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Description

We measured EAPFS above Zn-M2, 3 edge of single crystal ZnTe. From the results of the Fourier transform, we were able to abtain a nearest-neighbour atomic distance of 2.55Å. Furthermore, we tried to analyze the EAPFS obtained after O2 exposure. Although the EAPFS shows a similar structure with clean surface up to the exposure of 800L, the ZnO-like structure was observed after the exposure of 2000L. EAPFS method is considered to be useful in determining the nearest-neighbor atomic distance of the surface.

Journal

  • Shinku

    Shinku 33 (11), 874-878, 1990

    The Vacuum Society of Japan

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