書誌事項
- タイトル別名
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- Study on extended appearance potential fine structure of sigle crystal ZnTe.
- タンケッショウ ZnTe ノ カクチョウ シュツゲン デンイ ビサイ コウゾウ
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説明
We measured EAPFS above Zn-M2, 3 edge of single crystal ZnTe. From the results of the Fourier transform, we were able to abtain a nearest-neighbour atomic distance of 2.55Å. Furthermore, we tried to analyze the EAPFS obtained after O2 exposure. Although the EAPFS shows a similar structure with clean surface up to the exposure of 800L, the ZnO-like structure was observed after the exposure of 2000L. EAPFS method is considered to be useful in determining the nearest-neighbor atomic distance of the surface.
収録刊行物
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- 真空
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真空 33 (11), 874-878, 1990
一般社団法人 日本真空学会
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詳細情報 詳細情報について
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- CRID
- 1390282679042067456
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- NII論文ID
- 130000862928
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- NII書誌ID
- AN00119871
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- ISSN
- 18809413
- 05598516
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- NDL書誌ID
- 3688240
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可
