書誌事項
- タイトル別名
-
- Ion-Channeling Analysis of Lattice Defects in Single Crystals
- イオン チャネリング ニヨル ケッショウナイ コウシ ケッカン ノ カイセキ
この論文をさがす
説明
Channeling-effect measurements for structural analysis of lattice defects in single crystals are reviewed. Angle dependence of the yields of close collisions such as Rutherford backscattering, X-ray emission and nuclear reaction is shown to be powerful to determine the lattice site of impurity atoms and self-interstitial atoms constituting point-like defects. Energy dependence of the yields of dechanneling is also shown to provide quantitative information on the structure of extended and distortion-type defects such as stacking faults, twins, Guinier-Preston zones and dislocations.
収録刊行物
-
- 日本結晶学会誌
-
日本結晶学会誌 25 (3), 143-156, 1983
日本結晶学会
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1390282679063518336
-
- NII論文ID
- 130000784720
-
- NII書誌ID
- AN00188364
-
- ISSN
- 18845576
- 03694585
-
- NDL書誌ID
- 2592822
-
- 本文言語コード
- ja
-
- データソース種別
-
- JaLC
- NDLサーチ
- Crossref
- CiNii Articles
-
- 抄録ライセンスフラグ
- 使用不可