書誌事項
- タイトル別名
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- Preparation of (Ti,Al)N films by reactive binary sputtering.
- ハンノウセイ 2セイブン スパッタリング ニ ヨル Ti Al N マク ノ
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抄録
(Ti, Al)N films having various composition ratios of Ti and Al were deposited onto a hard alloy substrate by reactive RF sputtering using a single power source, the power from which was split by a variable coupling capacitor. A series of (Ti, Al)N specimens was obtained by changing voltage in a mixed argon-nitrogen atmosphere.<br>Film composition were measured by X-ray diffraction and EPMA.<br>The results showed that all the (Ti, Al)N films showed homogenous distribution of Ti and Al. X-ray patterns showed obvious formation of TiN for concentrated Ti side and AlN formation for Al riched side.<br>Those (Ti, Al)N films having Ti-to-Al ratios approximating 1 1 were amorphous. Hardness of the films was from Hv1200 to Hv1300.
収録刊行物
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- 表面技術
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表面技術 41 (5), 530-533, 1990
一般社団法人 表面技術協会
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詳細情報 詳細情報について
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- CRID
- 1390282679090899456
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- NII論文ID
- 130001073741
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- NII書誌ID
- AN1005202X
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- ISSN
- 18843409
- 09151869
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- NDL書誌ID
- 3667409
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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- 抄録ライセンスフラグ
- 使用不可