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Problems and Perspectives in Leading-Edge Semiconductor Wafer Cleaning Technology
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- HATTORI Takeshi
- Hattori Consulting International Electronic Materials and Processing Laboratory, Hanyang University
Bibliographic Information
- Other Title
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- 先端半導体洗浄技術の課題と展望
- センタン ハンドウタイ センジョウ ギジュツ ノ カダイ ト テンボウ
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Journal
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- Journal of The Surface Finishing Society of Japan
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Journal of The Surface Finishing Society of Japan 59 (8), 526-533, 2008
The Surface Finishing Society of Japan
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Details 詳細情報について
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- CRID
- 1390282679094003456
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- NII Article ID
- 10024277458
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- NII Book ID
- AN1005202X
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- COI
- 1:CAS:528:DC%2BD1cXhtVCntb7K
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- ISSN
- 18843409
- 09151869
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- NDL BIB ID
- 9610904
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles