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Electrical Resistivity of Doped Mott Insulators V2-yO3.
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- Nishimoto Satoshi
- Department of Physics, Faculty of Science and Technology, Science University of Tokyo, Noda 278
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- Moriya Toru
- Department of Physics, Faculty of Science and Technology, Science University of Tokyo, Noda 278
Bibliographic Information
- Other Title
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- Electrical Resistivity of Doped Mott In
- Electrical Resistivity of Doped Mott Insulators<b><i>V</i><sub>2-<i>y</i></sub><i>O</i><sub>3</sub></b>
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Description
The electrical resistivity of metallic V2-yO3 is calculated assuming that the antiferromagnetic spin fluctuations dominate the scattering mechanism for the conduction electrons. The spin fluctuations are described in terms of the self-consistent renormalization theory with parameter values estimated from the results of a neutron inelastic scattering experiment. The final result agrees reasonably well with the experimental results.
Journal
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- Journal of the Physical Society of Japan
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Journal of the Physical Society of Japan 65 (4), 905-907, 1996
THE PHYSICAL SOCIETY OF JAPAN
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Details 詳細情報について
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- CRID
- 1390282679157747072
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- NII Article ID
- 110001970160
- 210000100006
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- NII Book ID
- AA00704814
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- BIBCODE
- 1996JPSJ...65..905N
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- ISSN
- 13474073
- 00319015
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- NDL BIB ID
- 3956500
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- Text Lang
- en
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles
- OpenAIRE
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- Abstract License Flag
- Disallowed