TXRF Analysis of Solution Samples Using Polyester Film as a Disposable Sample-Carrier Cover.
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- YAMAGUCHI Hitoshi
- National Research Institute for Metals
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- ITOH Shinji
- National Research Institute for Metals
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- IGARASHI Shukuro
- Department of Materials Science, Faculty of Engineering, Ibaraki University
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- NAITOH Kunishige
- Department of Materials Science, Faculty of Engineering, Ibaraki University
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- HASEGAWA Ryosuke
- National Research Institute for Metals
書誌事項
- タイトル別名
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- TXRF Analysis of Solution Samples Using
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説明
The performance of polyester film was examined as a disposable cover of the sample-carrier (silicon wafer). The cover offers convenience and economy for the total reflection X-ray fluorescence (TXRF) analysis of solution samples. Moreover, the measurement of Al Kα (1.487 keV) and P Kα (2.013 keV) peaks is possible because of the reduction of Si Kα X-rays (1.740 keV) from the sample-carrier. Not only the trace elements (Cr, Mn, Co, Ni and Cu) but also the low sensitivity elements (Al and P) in JSS iron and steel standard samples were successfully analyzed.
収録刊行物
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- Analytical Sciences
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Analytical Sciences 14 (5), 909-912, 1998
社団法人 日本分析化学会
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キーワード
詳細情報 詳細情報について
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- CRID
- 1390282679235035904
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- NII論文ID
- 10002417200
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- NII書誌ID
- AA10500785
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- COI
- 1:CAS:528:DyaK1cXmslWqurs%3D
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- ISSN
- 13482246
- 09106340
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- NDL書誌ID
- 4576986
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可