TXRF Analysis of Solution Samples Using Polyester Film as a Disposable Sample-Carrier Cover.
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- YAMAGUCHI Hitoshi
- National Research Institute for Metals
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- ITOH Shinji
- National Research Institute for Metals
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- IGARASHI Shukuro
- Department of Materials Science, Faculty of Engineering, Ibaraki University
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- NAITOH Kunishige
- Department of Materials Science, Faculty of Engineering, Ibaraki University
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- HASEGAWA Ryosuke
- National Research Institute for Metals
Bibliographic Information
- Other Title
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- TXRF Analysis of Solution Samples Using
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Description
The performance of polyester film was examined as a disposable cover of the sample-carrier (silicon wafer). The cover offers convenience and economy for the total reflection X-ray fluorescence (TXRF) analysis of solution samples. Moreover, the measurement of Al Kα (1.487 keV) and P Kα (2.013 keV) peaks is possible because of the reduction of Si Kα X-rays (1.740 keV) from the sample-carrier. Not only the trace elements (Cr, Mn, Co, Ni and Cu) but also the low sensitivity elements (Al and P) in JSS iron and steel standard samples were successfully analyzed.
Journal
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- Analytical Sciences
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Analytical Sciences 14 (5), 909-912, 1998
The Japan Society for Analytical Chemistry
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Keywords
Details 詳細情報について
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- CRID
- 1390282679235035904
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- NII Article ID
- 10002417200
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- NII Book ID
- AA10500785
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- COI
- 1:CAS:528:DyaK1cXmslWqurs%3D
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- ISSN
- 13482246
- 09106340
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- NDL BIB ID
- 4576986
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- Text Lang
- en
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed