TXRF Analysis of Solution Samples Using Polyester Film as a Disposable Sample-Carrier Cover.

YAMAGUCHI Hitoshi, ITOH Shinji, IGARASHI Shukuro, NAITOH Kunishige, HASEGAWA Ryosuke

doi:10.2116/analsci.14.909

TXRF Analysis of Solution Samples Using Polyester Film as a Disposable Sample-Carrier Cover.

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YAMAGUCHI Hitoshi

National Research Institute for Metals
ITOH Shinji

National Research Institute for Metals
IGARASHI Shukuro

Department of Materials Science, Faculty of Engineering, Ibaraki University
NAITOH Kunishige

Department of Materials Science, Faculty of Engineering, Ibaraki University
HASEGAWA Ryosuke

National Research Institute for Metals

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タイトル別名

TXRF Analysis of Solution Samples Using

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説明

The performance of polyester film was examined as a disposable cover of the sample-carrier (silicon wafer). The cover offers convenience and economy for the total reflection X-ray fluorescence (TXRF) analysis of solution samples. Moreover, the measurement of Al K_α (1.487 keV) and P K_α (2.013 keV) peaks is possible because of the reduction of Si K_α X-rays (1.740 keV) from the sample-carrier. Not only the trace elements (Cr, Mn, Co, Ni and Cu) but also the low sensitivity elements (Al and P) in JSS iron and steel standard samples were successfully analyzed.