- 【Updated on May 12, 2025】 Integration of CiNii Dissertations and CiNii Books into CiNii Research
- Trial version of CiNii Research Automatic Translation feature is available on CiNii Labs
- Suspension and deletion of data provided by Nikkei BP
- Regarding the recording of “Research Data” and “Evidence Data”
Profile Simulation of SU-8 Thick Film Resist
-
- Yoshihisa Sensu
- Litho Tech Japan Corporation
-
- Atsushi Sekiguchi
- Litho Tech Japan Corporation
-
- Yoshiyuki Kondo
- Litho Tech Japan Corporation
-
- Satoshi Mori
- Nippon Kayaku Co., Ltd.
-
- Nao Honda
- Nippon Kayaku Co., Ltd.
-
- William D. Weber
- MicroChem Corp.
Search this article
Description
XP SU-8 3000 (hereinafter referred to as "SU-8") thick-film resist is a chemically amplified negative resist based on epoxy resin. Here, we report on the profile simulation for this resist. Profile simulation is an important technique for planning experiments. Thus, there have been many reports on simulation techniques. In particular, many studies have been conducted on chemically amplified positive resists, as they are major resist materials used in the IC industry. However, there have been few simulation studies concerning chemically amplified negative resists.<br>Thus, we conducted studies on the two-stage PEB process for a chemically amplified negative resist and reported the results [1]. In this article, the process is modified from the previous two-stage PEB process to a single-stage PEB process, the effects of the crosslinking reaction are measured, and a simulation technique is studied.
Journal
-
- Journal of Photopolymer Science and Technology
-
Journal of Photopolymer Science and Technology 18 (1), 125-132, 2005
The Society of Photopolymer Science and Technology(SPST)
- Tweet
Details 詳細情報について
-
- CRID
- 1390282679301133056
-
- NII Article ID
- 130004464407
- 40006743871
-
- NII Book ID
- AA11576862
-
- COI
- 1:CAS:528:DC%2BD2MXmtVGku7w%3D
-
- ISSN
- 13496336
- 09149244
-
- NDL BIB ID
- 7338118
-
- Text Lang
- en
-
- Data Source
-
- JaLC
- NDL Search
- Crossref
- CiNii Articles
-
- Abstract License Flag
- Disallowed