Dismantling Behavior of Pressure Sensitive Adhesives Using Acrylic Block and Random Copolymers in Response to Photoirradiation and Postbaking
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- Sato Eriko
- Department of Applied Chemistry and Bioengineering, Graduate School of Engineering, Osaka City University Department of Applied Chemistry, Graduate School of Engineering, Osaka Prefecture University
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- Taniguchi Kentaro
- Department of Applied Chemistry, Graduate School of Engineering, Osaka Prefecture University
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- Inui Tadashi
- Department of Applied Chemistry, Graduate School of Engineering, Osaka Prefecture University
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- Yamanishi Keisuke
- Department of Applied Chemistry, Graduate School of Engineering, Osaka Prefecture University
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- Horibe Hideo
- Department of Applied Chemistry, Graduate School of Engineering, Osaka Prefecture University
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- Matsumoto Akikazu
- Department of Applied Chemistry and Bioengineering, Graduate School of Engineering, Osaka City University Department of Applied Chemistry, Graduate School of Engineering, Osaka Prefecture University
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The formation of void between a PET support film and an adhesive layer is one of the reasons for the PET interfacial failure of B1 (PtBAw-b-(tBAx-co-2EHAy-co-HEAz)) after the dismantling. However, a major part of B1 specimens was occupied by pillar-like structures, even where PET interfacial failure was observed. It seems that the macroscopic morphology of adhesive layers is not only factors to determine failure modes. Although both R1 (P(tBAx-co-2EHAy-co-HEAz) and the soft segment of B1 have much lower Tg than room temperature, their mechanical properties seems to be different after the dismantling treatment as being indicated by ΔCp values. The fact that B2 is resulted in cohesive failure in spite of very low peel strength after the dismantling suggests the important role of cross-linking on cohesive force.
収録刊行物
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- Journal of Photopolymer Science and Technology
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Journal of Photopolymer Science and Technology 27 (4), 531-534, 2014
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詳細情報 詳細情報について
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- CRID
- 1390282679301733504
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- NII論文ID
- 130004687623
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- NII書誌ID
- AA11576862
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- ISSN
- 13496336
- 09149244
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- NDL書誌ID
- 025604512
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可