Fabrication of Reactive Ion Etching Systems for Deep Silicon Machining
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- Kong Seongho
- Faculty of Engineering, Tohoku University
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- Minami Kazuyuki
- Faculty of Engineering, Tohoku University
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- Esashi Masayoshi
- Faculty of Engineering, Tohoku University
書誌事項
- タイトル別名
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- Process Technology for Micromachines. Fabrication of Reactive Ion Etching Systems for Deep Silicon Machining.
- Fabrication of Reactive Ion Etching Sys
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説明
Reactive ion etching (RIE) systems using capacitively coupled plasma (CCP) and inductively coupled plasma (ICP) sources with SF6 gas have been developed for deep silicon machining with high aspect ratio. The developed RIE systems demonstrated high etch rate (2.3μm/min) and high selectivity (1700) for a sputtered nickel mask in silicon etching. A large capacity turbo molecular pump (TMP) with a small etching chamber was used to realize a low pressure with a high flow rate of etching gas. A circulatory cooling apparatus was used for cooling a silicon wafer. Etch rate showed uniformity within 10% for the area of 50cm2. Using the RIE system, we succeeded to etch a 200μm thick silicon wafer vertically through the thickness with an aspect ratio greater than 10. The RIE can be applied to fabricate three-dimensional silicon microstructures.
収録刊行物
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- 電気学会論文誌E(センサ・マイクロマシン部門誌)
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電気学会論文誌E(センサ・マイクロマシン部門誌) 117 (1), 10-14, 1997
一般社団法人 電気学会
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詳細情報 詳細情報について
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- CRID
- 1390282679436977024
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- NII論文ID
- 10004831812
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- NII書誌ID
- AN1052634X
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- ISSN
- 13475525
- 13418939
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- NDL書誌ID
- 4106302
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
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