Chemical Durability of AMLCD Glass Substrate : Corrosion of Glass Substrates by Hydrofluoric and Buffered Hydrofluoric Acids
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- Miwa Shinkichi
- Nippon Electric Glass Co., LTD.
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- Yamamoto Shigeru
- Nippon Electric Glass Co., LTD.
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- Onoda Takuhiro
- Nippon Electric Glass Co., LTD.
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- Miyamoto Mitsuo
- Morita Chemical Industries Co., LTD.
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- Ishida Shoichi
- Morita Chemical Industries Co., LTD.
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- Kita Naohide
- Morita Chemical Industries Co., LTD.
Bibliographic Information
- Other Title
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- AMLCD用ガラス基板の耐薬品性 : 特にフッ酸およびバッファードフッ酸による浸食について : 材料・部品および周辺技術関連 : 情報ディスプレイ
Description
The Chemical durability of AMLCD glass substrates was evaluated with various acids such as HCl. HNO_3, H_2SO_4, HF, buffered hydrofluoric acid (BHF), and alkali. NaOH. When treated with BHF, the surface of the glass substrates turned dim, sometimes. Microscopic obserbation revealed that the dim area corresponded to a lot of tiny hillocks. It has been concluded that there exist an effective composition of BHF as well as a recommendable cleaning condition of glass substrates to prevent the generation of tiny hillocks.
Journal
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- ITE Technical Report
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ITE Technical Report 17 (44), 25-31, 1993
The Institute of Image Information and Television Engineers
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Details 詳細情報について
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- CRID
- 1390282679497414400
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- NII Article ID
- 110003678579
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- ISSN
- 24330914
- 03864227
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles
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- Abstract License Flag
- Disallowed