Inspection Technique of Foreign Objects in BGA Solder Joint Using Oblique X-ray Computed Tomography
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- Noguchi Kenji
- Opt-Electronics Division, Nagoya Electric Works Co., Ltd.
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- Teramoto Atsushi
- School of Health Sciences, Fujita Health University
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- Yamada Muneo
- Faculty of Science and Technology, Meijo University
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- Murakoshi Takayuki
- Opt-Electronics Division, Nagoya Electric Works Co., Ltd.
Bibliographic Information
- Other Title
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- 傾斜型X線CTを用いたBGAはんだ接合部の異物検査手法
- ケイシャガタ Xセン CT オ モチイタ BGA ハンダ セツゴウブ ノ イブツ ケンサ シュホウ
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Description
Foreign objects in a solder joint could deteriorate the joint strength when mounting BGA (Ball Grid Array) packages or CSP (Chip Scale Package) on printed circuit boards. However, foreign objects within solder bumps are not detected by optical inspection which has been used widely. Recently, X-ray computed tomography (CT) for the inspection of printed circuit boards has been developed. X-ray CT visualizes the foreign objects inside a solder joint. If they are automatically detected, higher soldering quality is expected. In this paper, we propose an automated detection method of foreign objects in solder joints using CT slice images. In the method, some characteristic values are identified which show the solder joint deformation. In the experiments, actual mounting substrates involving solder bumps contaminated by foreign objects were checked using the proposed method. The detection accuracy rate reached 98.9%, which clearly indicates that the proposed method is useful in practice.
Journal
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- Journal of The Japan Institute of Electronics Packaging
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Journal of The Japan Institute of Electronics Packaging 13 (1), 63-70, 2010
The Japan Institute of Electronics Packaging
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Details 詳細情報について
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- CRID
- 1390282679537858176
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- NII Article ID
- 10025984502
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- NII Book ID
- AA11231565
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- COI
- 1:CAS:528:DC%2BC3cXhs1Oqs70%3D
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- ISSN
- 1884121X
- 13439677
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- NDL BIB ID
- 10549752
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles
- OpenAIRE
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- Abstract License Flag
- Disallowed