Probing of Carrier Injection into Organic Field Effect Transistor by Optical Second Harmonic Generation
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- Lim Eunju
- Department of Physical Electronics, Tokyo Institute of Technology
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- Manaka Takaaki
- Department of Physical Electronics, Tokyo Institute of Technology
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- Iwamoto Mitsumasa
- Department of Physical Electronics, Tokyo Institute of Technology
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Abstract
To probe the carrier injection from Au source electrode into the channel of pentacene field effect transistors (FET), optical second harmonic generation (SHG) measurement is employed. SHG is enhanced at the off state due to Laplace electric field formation, whereas it is diminished at the on state. As the generation of SHG signal is in proportional to the electric field formed in the channel, we concluded that SHG measurement can probe the change of the electric field in the pentacene FET channel due to the injected and subsequently trapped holes.
Journal
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- IEEJ Transactions on Fundamentals and Materials
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IEEJ Transactions on Fundamentals and Materials 127 (5), 261-264, 2007
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390282679569719424
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- NII Article ID
- 10019932374
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- NII Book ID
- AN10136312
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- ISSN
- 13475533
- 03854205
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- NDL BIB ID
- 8808255
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- Text Lang
- en
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed