書誌事項
- タイトル別名
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- Atomic-level Material Removal Mechanism of Graphite Studied by STM and MD.
- ソウサガタ トンネル ケンビキョウ オヨビ ブンシ ドウリキガクホウ ニ ヨル
- 公開日
- 1998
- DOI
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- 10.2493/jjspe.64.1653
- 公開者
- 公益社団法人 精密工学会
この論文をさがす
説明
Atomic-level material removal process of HOPG (Highly Oriented Pyrolytic Graphite) is analyzed by STM (Scanning unneling Microscope) and MD (Molecular Dynamic) simulation. By using STM tip scanning system, the material removal such as indentation and scratching is carried out in atomic scale. This deformation process is also analyzed by MD computer simulation. The trace on several nanometers generated by STM tip machining is observed, but undeformed region which shows typical atomic arrangement of graphite is recognized near from the deformation region. Good consistency between experiment and calculation can be found.
収録刊行物
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- 精密工学会誌
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精密工学会誌 64 (11), 1653-1657, 1998
公益社団法人 精密工学会
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詳細情報 詳細情報について
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- CRID
- 1390282679742284544
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- NII論文ID
- 110001372320
- 10004271845
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- NII書誌ID
- AN1003250X
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- ISSN
- 1882675X
- 09120289
- http://id.crossref.org/issn/09120289
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- NDL書誌ID
- 4597394
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDLサーチ
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可
